Invention Grant
- Patent Title: Method and system for dimensional analysis of an object
- Patent Title (中): 对象的尺寸分析方法和系统
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Application No.: US14196260Application Date: 2014-03-04
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Publication No.: US09351697B2Publication Date: 2016-05-31
- Inventor: Thomas James Batzinger , Gareth William David Lewis , Jonathan Matthew Lomas , Christopher Edward Thompson , Birol Turan
- Applicant: General Electric Company
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Hoffman Warnick LLC
- Agent Ernest G. Cusick
- Main IPC: A61B6/00
- IPC: A61B6/00 ; G01B9/08 ; G06T7/00 ; G06T5/00 ; G01B15/00 ; G01B15/04 ; G01B21/04 ; G01B11/24

Abstract:
The invention relates generally to the measurement and dimensional analysis of an object and, more particularly, to the correction of distortion in volumetric data of the object using dimensional data of the object. In one embodiment, the invention provides a method of analyzing an object, the method comprising: acquiring volumetric data of an object using an X-ray computed tomography (CT) imaging system; acquiring dimensional data of the object using a vision-based system; determining whether the volumetric data include a distortion; and in the case that the volumetric data are determined to include a distortion, correcting the distortion in the volumetric data using the dimensional data.
Public/Granted literature
- US20150254817A1 METHOD AND SYSTEM FOR DIMENSIONAL ANALYSIS OF AN OBJECT Public/Granted day:2015-09-10
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