发明授权
- 专利标题: Method of determining a calibration time interval for a calibration of a measurement device
- 专利标题(中): 确定测量装置的校准的校准时间间隔的方法
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申请号: US14363871申请日: 2012-11-22
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公开(公告)号: US09354091B2公开(公告)日: 2016-05-31
- 发明人: Dimitri Vaissiere
- 申请人: Endress + Hauser Messtechnik GmbH + Co. KG
- 申请人地址: DE Weil Am Rhein
- 专利权人: ENDRESS + HAUSER MESSTECHNIK GMBH + CO. KG
- 当前专利权人: ENDRESS + HAUSER MESSTECHNIK GMBH + CO. KG
- 当前专利权人地址: DE Weil Am Rhein
- 代理机构: Bacon & Thomas, PLLC
- 优先权: EP11192727 20111209
- 国际申请: PCT/EP2012/073311 WO 20121122
- 国际公布: WO2013/083411 WO 20130613
- 主分类号: G01D18/00
- IPC分类号: G01D18/00 ; G06F17/40 ; G06F19/00 ; G05B19/401
摘要:
A method of determining a calibration time interval for a calibration of a measurement device for measuring a quantity to be measured, which allows a safe optimization of calibration time intervals between consecutive calibrations. Performing a first calibration of the device at a first calibration time; adjusting, repairing or replacing the device and restarting the method from the beginning in case the first measurement error exceeds a predetermined error range including zero; performing a second calibration of the device at a second calibration time, adjusting, repairing or replacing the device and restarting the method from the beginning in case the second measurement error exceeds a maximum permissible error; determining the calibration time, at which a third calibration of the device shall be performed, and which is determined based on the first and the second measurement error, a probability density function for determining a measurement error of the device solely due to a calibration uncertainty inherent to the first calibration, a probability density function for determining a measurement error of the device solely due to a calibration uncertainty inherent to the second calibration, and the first and the second calibration time.
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