发明授权
- 专利标题: Temperature/voltage detection circuit
- 专利标题(中): 温度/电压检测电路
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申请号: US14193563申请日: 2014-02-28
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公开(公告)号: US09354124B2公开(公告)日: 2016-05-31
- 发明人: Jaw-Juinn Horng , Szu-Lin Liu , Chung-Hui Chen
- 申请人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- 申请人地址: TW
- 专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- 当前专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- 当前专利权人地址: TW
- 代理机构: Hauptman Ham, LLP
- 主分类号: H03K5/153
- IPC分类号: H03K5/153 ; G01K7/01 ; G01R19/00
摘要:
A circuit includes a comparator unit, a capacitive device, and a switching network. The comparator unit is configured to set a control signal at a first logical value when an output voltage reaches a first voltage value from being less than the first voltage value, and to set the control signal at a second logical value when the output voltage reaches a second voltage value from being greater than the second voltage. The capacitive device provides the output voltage. The switching network is configured to charge or discharge the capacitive device based on the control signal.
公开/授权文献
- US20140368264A1 TEMPERATURE/VOLTAGE DETECTION CIRCUIT 公开/授权日:2014-12-18
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