Invention Grant
- Patent Title: Magnetic measurement device
- Patent Title (中): 磁性测量装置
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Application No.: US14374786Application Date: 2012-12-13
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Publication No.: US09354285B2Publication Date: 2016-05-31
- Inventor: Kenichi Suzuki , Tsutomu Chikamatsu , Akio Ogawa , Kyung-ku Choi , Ryuji Hashimoto
- Applicant: TDK CORPORATION
- Applicant Address: JP Tokyo
- Assignee: TDK CORPORATION
- Current Assignee: TDK CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Priority: JP2012-014551 20120126
- International Application: PCT/JP2012/082277 WO 20121213
- International Announcement: WO2013/111468 WO 20130801
- Main IPC: G01R33/12
- IPC: G01R33/12 ; G01R33/10

Abstract:
A magnetic measurement device which measures coercivity and coercivity distribution in a microregion of a thin plate magnetic sample with high coercivity. A magnetic sample is applied with a magnetic field in a first direction and magnetized, a second magnetic field is applied in a direction opposite to the first, a measuring part scans the sample, measuring magnetic flux leakage due to remnant magnetization in the sample. The intensity of the second magnetic field is gradually increased while the measuring part repeats the measurement to obtain the second magnetic field wherein the magnitude of the leakage from the sample reaches the maximum level, and when a magnetic field equivalent to the coercivity is applied to the sample and about half of the magnetization is reversed, the sample's coercivity is obtained based on the determination that the demagnetizing field Hd reaches the minimum level and the leakage reaches the maximum level.
Public/Granted literature
- US20150070005A1 MAGNETIC MEASUREMENT DEVICE Public/Granted day:2015-03-12
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