发明授权
- 专利标题: Controlling phase response in a sub-wavelength grating lens
- 专利标题(中): 控制亚波长光栅透镜中的相位响应
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申请号: US13640348申请日: 2010-04-13
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公开(公告)号: US09354363B2公开(公告)日: 2016-05-31
- 发明人: Wei Wu , R. Stanley Williams , Jingjing Li , Theodore I. Kamins , Marco Fiorentino
- 申请人: Wei Wu , R. Stanley Williams , Jingjing Li , Theodore I. Kamins , Marco Fiorentino
- 申请人地址: US TX Houston
- 专利权人: Hewlett Packard Enterprise Development LP
- 当前专利权人: Hewlett Packard Enterprise Development LP
- 当前专利权人地址: US TX Houston
- 代理机构: Hewlett Packard Enterprise Patent Department
- 国际申请: PCT/US2010/030832 WO 20100413
- 国际公布: WO2011/129814 WO 20111020
- 主分类号: G02B5/18
- IPC分类号: G02B5/18 ; B05D5/06
摘要:
A sub-wavelength grating device having controlled phase response includes a grating layer having line widths, line thicknesses, line periods, and line spacings selected to produce a first level of control in phase changes of different portions of a beam of light reflected from the grating layer. The device also includes a substrate affixed to the grating layer that produces a second level of control in phase changes of different portions of a beam of light reflected from the grating layer, the second level of control being accomplished abrupt stepping of the substrate in a horizontal dimension, ramping the substrate in a horizontal dimension, or changing the index of refraction in a horizontal dimension.
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