Invention Grant
- Patent Title: System test apparatus
- Patent Title (中): 系统测试仪
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Application No.: US13704490Application Date: 2011-03-15
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Publication No.: US09354996B2Publication Date: 2016-05-31
- Inventor: Byoung Ju Choi , Joo Young Seo , Sueng Wan Yang , Jin Yong Lim , Young Su Kim , Jung Suk Oh , Hae Young Kwon , Seung Yeun Jang
- Applicant: Byoung Ju Choi , Joo Young Seo , Sueng Wan Yang , Jin Yong Lim , Young Su Kim , Jung Suk Oh , Hae Young Kwon , Seung Yeun Jang
- Applicant Address: KR Seoul KR Seoul KR Seoul
- Assignee: Hyundai Motor Company,Kia Motors Corporation,Ehwa University Industry Collaboration Foundation
- Current Assignee: Hyundai Motor Company,Kia Motors Corporation,Ehwa University Industry Collaboration Foundation
- Current Assignee Address: KR Seoul KR Seoul KR Seoul
- Agency: Mintz Levin Cohn Ferris Glovsky and Popeo, P.C.
- Agent Peter F. Corless
- Priority: KR10-2010-0061455 20100628; WOPCT/KR2010/006068 20100907
- International Application: PCT/KR2011/001803 WO 20110315
- International Announcement: WO2012/002635 WO 20120105
- Main IPC: G06F11/26
- IPC: G06F11/26 ; G06F11/36
Abstract:
The present invention relates to a system test apparatus. The system test apparatus includes an insertion module configured to insert a test agent into a process control block, a hooking module configured to hook a test target to a test code using the test agent when an event related to the test target occurs, a scanning module configured to collect pieces of test information about a process in which the event related to the test target has occurred when the test target is hooked, and a logging module configured to store the pieces of test information collected by the scanning module.
Public/Granted literature
- US20130086425A1 SYSTEM TEST APPARATUS Public/Granted day:2013-04-04
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