- 专利标题： High-resolution tracking of industrial process materials using trace incorporation of luminescent markers
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申请号： US11919979申请日： 2006-05-10
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公开(公告)号： US09361561B2公开(公告)日： 2016-06-07
- 发明人: Mark Bown , John Kraft , Anton Launikonis , Peter Osvath , Gerhard Frederick Swiegers
- 申请人： Mark Bown , John Kraft , Anton Launikonis , Peter Osvath , Gerhard Frederick Swiegers
- 申请人地址： AU New South Wales
- 专利权人： DATATRACE DNA PTY
- 当前专利权人： DATATRACE DNA PTY
- 当前专利权人地址： AU New South Wales
- 代理机构： Nixon & Vanderhye PC
- 优先权： AU2005902346 20050510
- 国际申请： PCT/AU2006/000608 WO 20060510
- 国际公布： WO2006/119561 WO 20061116
- 主分类号： G01J1/58
- IPC分类号： G01J1/58 ; G06K19/06 ; G01N21/88 ; G06K17/00 ; G01N21/64
摘要：
A method of marking an industrial process material including selectively incorporating a luminescent marker onto and/or into the industrial process material in a trace amount insufficient to be optically detectable in the presence of ambient light but sufficient to be non-destructively optically detectable in and/or on the industrial proce material in situ in the field or on-site. The trace amount of the luminescent marker is used to track, identify authenticate the industrial process material for at least one of material control, inventory control, stock control, logistics control, quality control and pollution control.
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