Invention Grant
- Patent Title: Temperature measuring apparatus and temperature measuring method
- Patent Title (中): 温度测量仪和温度测量方法
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Application No.: US14414977Application Date: 2014-04-28
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Publication No.: US09366575B2Publication Date: 2016-06-14
- Inventor: Tatsuo Itoh , Shinichi Shikii , Koichi Kusukame
- Applicant: Panasonic Intellectual Property Corporation of America
- Applicant Address: US CA Torrance
- Assignee: PANASONIC INTELLECTUAL PROPERTY CORPORATION OF AMERICA
- Current Assignee: PANASONIC INTELLECTUAL PROPERTY CORPORATION OF AMERICA
- Current Assignee Address: US CA Torrance
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2013-105303 20130517
- International Application: PCT/JP2014/002358 WO 20140428
- International Announcement: WO2014/185024 WO 20141120
- Main IPC: G01J5/08
- IPC: G01J5/08 ; H04N5/33 ; H04N5/225 ; H04N5/232 ; G01J5/00 ; G06K9/00

Abstract:
A temperature measuring apparatus includes: an infrared measuring unit; a guide light emitting unit; an optical unit that (i) allows the guide light emitted by the guide light emitting unit to travel toward the object, and (ii) allows the infrared radiation radiated from the object to enter the infrared measuring unit; a position adjusting unit that makes a position adjustment of irradiating the measurement target region with the guide light emitted by the guide light emitting unit while keeping within a predetermined range a misalignment between an optical axis of the infrared radiation entering the infrared measuring unit from the measurement target region and an optical axis of the guide light emitted by the guide light emitting unit; and a focusing unit that adjusts a focus of the infrared measuring unit and a focus of the guide light emitting unit.
Public/Granted literature
- US20150168219A1 TEMPERATURE MEASURING APPARATUS AND TEMPERATURE MEASURING METHOD Public/Granted day:2015-06-18
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