Invention Grant
- Patent Title: Arm type three-dimensional measuring apparatus and deflection correction method in arm type three-dimensional measuring apparatus
- Patent Title (中): 臂式三维测量装置中的臂式三维测量装置和偏转校正方法
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Application No.: US14546356Application Date: 2014-11-18
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Publication No.: US09366592B2Publication Date: 2016-06-14
- Inventor: Tomonori Goto
- Applicant: Mitutoyo Corporation
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Oliff PLC
- Priority: JP2013-242409 20131122
- Main IPC: G01B5/008
- IPC: G01B5/008 ; G01L5/16 ; G01B21/04 ; G01L5/22

Abstract:
An arm type three-dimensional measuring apparatus includes: a multi-jointed arm mechanism including a probe in a distal end; a processing part for computing a position of the probe, the probe being manually moved; a sensor which is formed in each axis of the multi-jointed arm mechanism and detects at least a force in one predetermined direction and torques in two predetermined axial directions generated in an attitude state of the multi-jointed arm mechanism, wherein the processing part computes a deflection amount in each axis of the multi-jointed arm mechanism based on an output of the sensor and sequentially computes a position of the probe based on the deflection amount.
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