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US09367660B2 Electromigration-aware layout generation 有权
电迁移感知布局生成

Electromigration-aware layout generation
摘要:
In some embodiments, in a method, cell layouts of a plurality of cells are received. For each cell, a respective constraint that affects a geometry of an interconnect to be coupled to an output pin of the cell in a design layout is determined based on a geometry of the output pin of the cell in the cell layout.
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