Invention Grant
US09368232B2 Magnetic automatic test equipment (ATE) memory tester device and method employing temperature control
有权
磁性自动测试设备（ATE）记忆测试仪器和采用温度控制的方法
- Patent Title: Magnetic automatic test equipment (ATE) memory tester device and method employing temperature control
- Patent Title (中): 磁性自动测试设备（ATE）记忆测试仪器和采用温度控制的方法
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Application No.: US13787938Application Date: 2013-03-07
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Publication No.: US09368232B2Publication Date: 2016-06-14
- Inventor: Kangho Lee , Wah Nam Hsu , Xiao Lu , Seung H. Kang
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: Qualcomm Incorporated
- Current Assignee: Qualcomm Incorporated
- Current Assignee Address: US CA San Diego
- Agency: Toler Law Group, PC
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11C29/08 ; G11C11/16 ; G11C7/04 ; G01R31/27 ; G11C29/04 ; G11C29/56
Abstract:
In a particular embodiment, a method includes controlling a temperature within a chamber while applying a magnetic field. A device including a memory array is located in the chamber. The method includes applying a magnetic field to the memory array and testing the memory array during application of the magnetic field to the memory array at a target temperature.
Public/Granted literature
- US20140254251A1 MAGNETIC AUTOMATIC TEST EQUIPMENT (ATE) MEMORY TESTER DEVICE AND METHOD EMPLOYING TEMPERATURE CONTROL Public/Granted day:2014-09-11
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