Invention Grant
US09368715B2 Reducing source loading effect in spin torque transfer magnetoresistive random access memory (STT-MRAM)
有权
降低自旋转矩磁阻随机存取存储器(STT-MRAM)中的源负载效应
- Patent Title: Reducing source loading effect in spin torque transfer magnetoresistive random access memory (STT-MRAM)
- Patent Title (中): 降低自旋转矩磁阻随机存取存储器(STT-MRAM)中的源负载效应
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Application No.: US14822295Application Date: 2015-08-10
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Publication No.: US09368715B2Publication Date: 2016-06-14
- Inventor: Kangho Lee , Seung Kang , Xiaochun Zhu
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agent Donald D. Min; Paul Holdaway
- Main IPC: G11C11/16
- IPC: G11C11/16 ; H01L43/08 ; H01L43/02 ; G06F17/50 ; H01L43/12

Abstract:
A memory cell includes a magnetic tunnel junction (MTJ) structure that includes a free layer coupled to a bit line and a pinned layer. A magnetic moment of the free layer is substantially parallel to a magnetic moment of the pinned layer in a first state and substantially antiparallel to the magnetic moment of the pinned layer in a second state. The pinned layer has a physical dimension to produce an offset magnetic field corresponding to a first switching current of the MTJ structure to enable switching between the first state and the second state when a first voltage is applied from the bit line to a source line coupled to an access transistor and a second switching current to enable switching between the second state and the first state when the first voltage is applied from the source line to the bit line.
Public/Granted literature
- US20150349244A1 REDUCING SOURCE LOADING EFFECT IN SPIN TORQUE TRANSFER MAGNETORESISTIVE RANDOM ACCESS MEMORY (STT-MRAM) Public/Granted day:2015-12-03
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