Invention Grant
- Patent Title: Interconnect speed model characterization in programmable integrated circuits
- Patent Title (中): 可编程集成电路中的互连速度模型表征
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Application No.: US14730609Application Date: 2015-06-04
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Publication No.: US09372948B1Publication Date: 2016-06-21
- Inventor: Nagaraj Savithri
- Applicant: Xilinx, Inc.
- Applicant Address: US CA San Jose
- Assignee: XILINX, INC.
- Current Assignee: XILINX, INC.
- Current Assignee Address: US CA San Jose
- Agent Keith Taboado; Robert M. Brush; Joshua Hamberger
- Main IPC: H03K19/00
- IPC: H03K19/00 ; G06F17/50 ; G01R31/317 ; G01R31/28 ; G01R31/3185

Abstract:
Techniques for using a speed measurement circuit to measure speed of an integrated circuit. The speed measurement circuit includes a ring oscillator and a counter circuit. The ring oscillator includes an AND gate with an inverting input and a non-inverting input. The ring oscillator also includes a programmable interconnect point context (PIP-context) having a first programmable interconnect point (PIP), a first interconnect, a second PIP, and a second interconnect coupled in series. The ring oscillator also includes a third interconnect and a third PIP coupled in series with the PIP-context and with an inverting input of the AND gate. The counter circuit is coupled to an output of the AND gate and configured in the programmable integrated circuit.
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