Invention Grant
- Patent Title: Resistance variable element methods and apparatuses
- Patent Title (中): 电阻可变元件的方法和装置
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Application No.: US13947807Application Date: 2013-07-22
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Publication No.: US09373399B2Publication Date: 2016-06-21
- Inventor: Seshadri K. Kolluri , Rajesh N. Gupta
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C13/00 ; G11C11/56

Abstract:
Apparatus and methods are disclosed, including a method that performs a first operation on a first resistance variable element using a common source voltage, a first data line voltage and a first control gate voltage, and then performs a second operation on a second resistance variable element using the common source voltage, a second data line voltage and a second control gate voltage. Additional apparatus and methods are described.
Public/Granted literature
- US20150023089A1 RESISTANCE VARIABLE ELEMENT METHODS AND APPARATUSES Public/Granted day:2015-01-22
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