Invention Grant
- Patent Title: Transistor and method of manufacturing the same
- Patent Title (中): 晶体管及其制造方法
-
Application No.: US14500626Application Date: 2014-09-29
-
Publication No.: US09373712B2Publication Date: 2016-06-21
- Inventor: Jhong-Sheng Wang , Jiaw-Ren Shih
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Maschoff Brennan
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L29/78

Abstract:
A transistor includes source region and drain regions, a channel region, a drift region, a gate, a dummy gate, a gate dielectric layer and an interconnection line. The source and drain regions of a first conductivity type are in a substrate. The channel region of a second conductivity type is in the substrate and surrounds the source region. The drift region of the first conductivity type is beneath the drain region and extends toward the channel region. The gate is over the substrate and overlapped with the channel region and the drift region. The dummy gate is over the drift region and laterally adjacent to the gate. The gate dielectric layer is between the gate and the substrate and between the dummy gate and the drift region. The interconnection line is electrically connected to the dummy gate and configured to provide a voltage potential thereto.
Public/Granted literature
- US20160093729A1 TRANSISTOR AND METHOD OF MANUFACTURING THE SAME Public/Granted day:2016-03-31
Information query
IPC分类: