Invention Grant
- Patent Title: Standard light source having restriction portion for diffuse reflection and measurement method
- Patent Title (中): 具有用于漫反射和测量方法的限制部分的标准光源
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Application No.: US14161690Application Date: 2014-01-23
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Publication No.: US09377352B2Publication Date: 2016-06-28
- Inventor: Kazuaki Ohkubo
- Applicant: Otsuka Electronics Co., Ltd.
- Applicant Address: JP Hirakata-Shi
- Assignee: OTSUKA ELECTRONICS CO., LTD.
- Current Assignee: OTSUKA ELECTRONICS CO., LTD.
- Current Assignee Address: JP Hirakata-Shi
- Agency: Mori & Ward, LLP
- Priority: JP2013-026571 20130214
- Main IPC: G01J1/08
- IPC: G01J1/08 ; G01J1/42 ; G01J1/06

Abstract:
A novel standard light source with a more simplified construction, which is suitable for measurement of total luminous flux of a light source different in luminous intensity distribution characteristics from a conventional standard light source, and a measurement method with the use of that standard light source are provided. A standard light source includes a light emitting portion, a power feed portion electrically connected to the light emitting portion, and a restriction portion provided between the light emitting portion and the power feed portion, for restricting propagation of light radiated from the light emitting portion toward the power feed portion. A surface of the restriction portion on which light from the light emitting portion is incident is constructed for diffuse reflection.
Public/Granted literature
- US20140224970A1 STANDARD LIGHT SOURCE AND MEASUREMENT METHOD Public/Granted day:2014-08-14
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