Invention Grant
US09378077B2 System for detecting operating errors in integrated circuits 有权
用于检测集成电路中的操作错误的系统

System for detecting operating errors in integrated circuits
Abstract:
Errors induced by noise pulses in digital electronic circuits clocked with a clock signal are detected by providing at least one additional clock signal offset in time with respect to the clock signal by a given interval, and performing for at least one component of the circuit a comparison of correspondence between two versions of one and the same signal. The comparison is clocked by the additional clock signal and the absence of correspondence between the two versions of said signal identifies an error induced in the circuit by a noise pulse.
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