- Patent Title: Three-dimensional mapping using scanning electron microscope images
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Application No.: US14609768Application Date: 2015-01-30
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Publication No.: US09378923B2Publication Date: 2016-06-28
- Inventor: Ishai Schwarzband , Yakov Weinberg
- Applicant: APPLIED MATERIALS ISRAEL, LTD.
- Applicant Address: IL Rehovot
- Assignee: Applied Materials Israel, Ltd.
- Current Assignee: Applied Materials Israel, Ltd.
- Current Assignee Address: IL Rehovot
- Agency: Lowenstein Sandler LLP
- Main IPC: H01J37/00
- IPC: H01J37/00 ; H01J37/24 ; H01J37/244 ; H01J37/28 ; G01B21/30 ; G01D18/00 ; H01J37/26 ; G01N23/225

Abstract:
A method includes irradiating a surface of a sample, which is made-up of multiple types of materials, with a beam of primary electrons. Emitted electrons emitted from the irradiated sample are detected using multiple detectors that are positioned at respective different positions relative to the sample, so as to produce respective detector outputs. Calibration factors are computed to compensate for variations in emitted electron yield among the types of the materials, by identifying, for each material type, one or more horizontal regions on the surface that are made-up of the material type, and computing a calibration factor for the material type based on at least one of the detector outputs at the identified horizontal regions. The calibration factors are applied to the detector outputs. A three-dimensional topographical model of the surface is calculated based on the detector outputs to which the calibration factors are applied.
Public/Granted literature
- US20150136960A1 THREE-DIMENSIONAL MAPPING USING SCANNING ELECTRON MICROSCOPE IMAGES Public/Granted day:2015-05-21
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