发明授权
- 专利标题: Metal contact for semiconductor device
- 专利标题(中): 半导体器件的金属接触
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申请号: US14440876申请日: 2013-10-30
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公开(公告)号: US09379077B2公开(公告)日: 2016-06-28
- 发明人: Chang-Ming Lin , Lei Shi , Honghui Wang
- 申请人: NANTONG FUJITSU MICROELECTRONICS CO., LTD.
- 申请人地址: CN Nantong, Jiangsu
- 专利权人: NANTONG FUJITSU MICROELECTRONICS CO., LTD.
- 当前专利权人: NANTONG FUJITSU MICROELECTRONICS CO., LTD.
- 当前专利权人地址: CN Nantong, Jiangsu
- 代理机构: RatnerPrestia
- 优先权: CN201210444454 20121108; CN201210445562 20121108
- 国际申请: PCT/CN2013/086210 WO 20131030
- 国际公布: WO2014/071813 WO 20140515
- 主分类号: H01L23/00
- IPC分类号: H01L23/00
摘要:
A semiconductor device package and packaging method, the semiconductor device packaging method comprising: providing a chip with a bonding pad formed on the chip surface; forming a passivation layer and a bump on the chip surface, wherein the passivation layer has an opening exposing part of the pad, the bump is located in the opening and the size of the bump is less than the size of the opening; forming a solder ball covering the top surface and the side wall of the bump, and the bottom surface of the opening. The formed semiconductor device package is not easy to form a short circuit. The bonding strength between the solder ball and the bump is high and the performance of the semiconductor device is stable.
公开/授权文献
- US20150303159A1 SEMICONDUCTOR DEVICE PACKAGE AND PACKAGING METHOD 公开/授权日:2015-10-22
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