Invention Grant
- Patent Title: On-chip linearity calibration
- Patent Title (中): 片内线性校准
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Application No.: US14507623Application Date: 2014-10-06
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Publication No.: US09379753B2Publication Date: 2016-06-28
- Inventor: Janakiram Ganesh Sankaranarayanan , Ojas Mahendra Choksi , Hasnain Mohammedi Lakdawala , Wei Zhuo , Faramarz Sabouri
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM INCORPORATED
- Current Assignee: QUALCOMM INCORPORATED
- Current Assignee Address: US CA San Diego
- Agency: Procopio, Cory, Hargreaves & Savitch, LLP
- Main IPC: H04B1/10
- IPC: H04B1/10 ; H04B1/12 ; H04B17/21 ; H04W88/02
Abstract:
An apparatus including: at least one receiver having injection points and having at least an amplifier and a transformer; and a plurality of isolation switches coupled to injection points of the at least one receiver, the plurality of isolation switches configured to route a calibration signal generated by a transmitter to one of the injection points.
Public/Granted literature
- US20160080018A1 ON-CHIP LINEARITY CALIBRATION Public/Granted day:2016-03-17
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