Invention Grant
- Patent Title: Device for measuring the accuracy of a mechanical watch
- Patent Title (中): 用于测量机械手表精度的装置
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Application No.: US14944990Application Date: 2015-11-18
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Publication No.: US09383725B2Publication Date: 2016-07-05
- Inventor: Michel Willemin , Cedric Decosterd , Thierry Hessler , Thierry Conus
- Applicant: The Swatch Group Research and Development Ltd.
- Applicant Address: CH Marin
- Assignee: The Swatch Group Research and Development Ltd.
- Current Assignee: The Swatch Group Research and Development Ltd.
- Current Assignee Address: CH Marin
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: EP10192725 20101126
- Main IPC: H04N7/18
- IPC: H04N7/18 ; G04D7/00 ; G04D7/12

Abstract:
A device for measuring the accuracy of a mechanical watch includes a time reference source, a calculating mechanism, and another data processing unit. The time reference source is formed by an internal time reference source, or by a receiving and processing mechanism arranged to receive and process signals transmitted by an external time source to permanently update a repeater clock internal to the device. The calculating mechanism is arranged to calculate time differences between display values, and/or between time reference points provided by the time reference source, and to calculate a variation in rate. The another data processing unit is arranged to store and process at least one variation in rate calculated by the calculating mechanism, and/or a viewing mechanism arranged to display at least one variation in rate calculated by the calculating mechanism.
Public/Granted literature
- US20160070236A1 DEVICE FOR MEASURING THE ACCURACY OF A MECHANICAL WATCH Public/Granted day:2016-03-10
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