Invention Grant
- Patent Title: Micromagnetometry detection system and method for detecting magnetic signatures of magnetic materials
- Patent Title (中): 微量元素检测系统及磁性材料磁特征检测方法
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Application No.: US14414430Application Date: 2013-07-12
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Publication No.: US09389285B2Publication Date: 2016-07-12
- Inventor: Férial Terki , Azzedine Bousseksou , Quang Hung Tran , Souleyman Kamara , CheolGi Kim , Kun Woo Kim , Philippe Gandit
- Applicant: Université de Montpellier , CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (C.N.R.S)
- Applicant Address: FR Montpellier FR Paris
- Assignee: UNIVERSITÉ DE MONTPELLIER,CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (C.N.R.S.)
- Current Assignee: UNIVERSITÉ DE MONTPELLIER,CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (C.N.R.S.)
- Current Assignee Address: FR Montpellier FR Paris
- Agency: Knobbe, Martens, Olson & Bear, LLP
- Priority: EP12305852 20120713
- International Application: PCT/EP2013/064775 WO 20130712
- International Announcement: WO2014/009516 WO 20140116
- Main IPC: G01R33/07
- IPC: G01R33/07 ; G01R33/09 ; B82Y25/00 ; G01R33/12

Abstract:
A micromagnetometry system for detecting the presence of very small quantities of magnetic particles comprises a first magnetic hybrid AMR/PHR multiring sensor using a Wheastone bridge electrical configuration, a first current source, a first voltage measurement device, a set of at least one magnetic particles deposited on the first magnetic sensor and a processing unit for detecting from a set of different measured differential voltages a magnetic flux shift representative of the presence of a least one deposited magnetic particle.The micromagnetometry system comprises means for creating a magnetic excitation field HAC to make produce by each motionless magnetic particle a stray magnetic field oscillating along the time at a constant frequency ω ranging from 10 Hz to 3 KHz.
Public/Granted literature
- US20150168507A1 MICROMAGNETOMETRY DETECTION SYSTEM AND METHOD FOR DETECTING MAGNETIC SIGNATURES OF MAGNETIC MATERIALS Public/Granted day:2015-06-18
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