Invention Grant
- Patent Title: Debug system, and related integrated circuit and method
- Patent Title (中): 调试系统及相关集成电路及方法
-
Application No.: US14038501Application Date: 2013-09-26
-
Publication No.: US09389979B2Publication Date: 2016-07-12
- Inventor: Daniele Mangano , Ignazio Antonino Urzi
- Applicant: STMicroelectronics (Grenoble 2) SAS , STMicroelectronics S.r.l.
- Applicant Address: FR Grenoble IT Agrate Brianza
- Assignee: STMICROELECTRONICS (GRENOBLE 2) SAS,STMICROELECTRONICS S.R.L.
- Current Assignee: STMICROELECTRONICS (GRENOBLE 2) SAS,STMICROELECTRONICS S.R.L.
- Current Assignee Address: FR Grenoble IT Agrate Brianza
- Agency: Seed IP Law Group PLLC
- Priority: ITTO2012A0851 20120928
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/27 ; G06F11/36 ; G06F11/22

Abstract:
A system includes a processor and a plurality of circuits connected through an interconnection network, wherein associated to each circuit is a respective communication interface configured for exchanging data between the respective circuit and the interconnection network. In particular, a debug unit is associated with each communication interface. Each debug unit is configurable as a data-insertion point, wherein the debug unit transmits data by means of the respective communication interface to the interconnection network, or each debug unit is configurable as a data-reception point, wherein the debug unit receives data by means of the respective communication interface from the interconnection network.
Public/Granted literature
- US20140095932A1 DEBUG SYSTEM, AND RELATED INTEGRATED CIRCUIT AND METHOD Public/Granted day:2014-04-03
Information query