Invention Grant
- Patent Title: System and method for automatic quality control for assembly line processes
- Patent Title (中): 装配线工艺自动质量控制的系统和方法
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Application No.: US13753607Application Date: 2013-01-30
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Publication No.: US09390491B2Publication Date: 2016-07-12
- Inventor: Kewei Zuo , Chien Rhone Wang , Tzu-Cheng Lin , Chih-Wei Lai
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Duane Morris LLP
- Main IPC: H04N7/18
- IPC: H04N7/18 ; G06T7/00
Abstract:
A system and method is disclosed for a quality control and/or inspection procedure for assembly line processes. The disclosed system and method enable automatic optical inspection of a device during different stages of manufacture as well as in its finished form. The disclosed system and method enable the automatic quality control process to be self-learning, dynamic, and to identify and classify defects in real time.
Public/Granted literature
- US20140210982A1 SYSTEM AND METHOD FOR AUTOMATIC QUALITY CONTROL FOR ASSEMBLY LINE PROCESSES Public/Granted day:2014-07-31
Information query
