Invention Grant
- Patent Title: System for image analysis and method thereof
- Patent Title (中): 图像分析系统及其方法
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Application No.: US13355358Application Date: 2012-01-20
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Publication No.: US09390517B2Publication Date: 2016-07-12
- Inventor: Youngil Kwon , Byoungkuk Kim , Jinseo Park , Taewon Kim , Youngseok Song , Inhwan Sul , Kiyeon Jo
- Applicant: Youngil Kwon , Byoungkuk Kim , Jinseo Park , Taewon Kim , Youngseok Song , Inhwan Sul , Kiyeon Jo
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung SDI Co., Ltd.
- Current Assignee: Samsung SDI Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Knobbe, Martens, Olson & Bear, LLP
- Priority: KR10-2011-0007283 20110125; KR10-2011-0128671 20111202
- Main IPC: G06T7/40
- IPC: G06T7/40 ; H04N7/18

Abstract:
A system for image analysis and a method thereof are disclosed. In one embodiment, the system includes a detector configured to receive an image of a sample, isolate particles from a background image of the sample image and detect positions of the isolated particles and a first operator configured to calculate a static degree of randomness values of the particles using Lennard-Jones potentials based on the detected positions. The system may further include a second operator configured to obtain a dynamic degree of randomness values of particles based at least in part on the sum of tensile forces between particles by implicit integration added until the particles reach a dynamic equilibrium, and calculate a positional degree of randomness of particles based at least in part on subtraction of the dynamic degree of randomness values from the static degree of randomness values.
Public/Granted literature
- US20120188361A1 SYSTEM FOR IMAGE ANALYSIS AND METHOD THEREOF Public/Granted day:2012-07-26
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