Invention Grant
- Patent Title: Multi-axis type three-dimensional measuring apparatus
- Patent Title (中): 多轴型三维测量仪
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Application No.: US14563205Application Date: 2014-12-08
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Publication No.: US09395169B2Publication Date: 2016-07-19
- Inventor: Shinsaku Abe
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kawasaki
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kawasaki
- Agency: Oliff PLC
- Priority: JP2013-255399 20131210
- Main IPC: G01B5/008
- IPC: G01B5/008 ; G01B21/04

Abstract:
A multi-axis type three-dimensional measuring apparatus includes a multi-axis arm mechanism, a probe formed in a distal end of the multi-axis arm mechanism and configured to measure a workpiece, and a projector formed in the distal end of the multi-axis arm mechanism and configured to scale a range of a projected projection image according to a distance between the workpiece and the probe. The projector is configured to project full-scale projection graphics of said workpiece so as to match the full-scale projection graphics with the workpiece regardless of a difference in a distance between the workpiece and the probe, and to project display information identifying a measurement schedule position by the probe.
Public/Granted literature
- US20150159987A1 MULTI-AXIS TYPE THREE-DIMENSIONAL MEASURING APPARATUS Public/Granted day:2015-06-11
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