Invention Grant
US09396793B2 Phase change memory, writing method thereof and reading method thereof
有权
相变存储器,其写入方法及其读取方法
- Patent Title: Phase change memory, writing method thereof and reading method thereof
- Patent Title (中): 相变存储器,其写入方法及其读取方法
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Application No.: US14276011Application Date: 2014-05-13
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Publication No.: US09396793B2Publication Date: 2016-07-19
- Inventor: Chao-I Wu , Ming-Hsiu Lee
- Applicant: Macronix International Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: MACRONIX INTERNATIONAL CO., LTD.
- Current Assignee: MACRONIX INTERNATIONAL CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: McClure, Qualey & Rodack, LLP
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C13/00

Abstract:
A phase change memory (PCM), a writing method thereof and a reading method thereof are provided. The PCM has a plurality of memory cells. The writing method comprises the following steps. At least one stress pulse is applied for aging at least one of the memory cells. A starting pulse is applied to all of the memory cells of the PCM for decreasing a resistance of each memory cell. A detection pulse is applied to all of the memory cells of the PCM for detecting the resistance of each memory cell. A set pulse is applied to the aged memory cells. A reset pulse is applied to the non-aged memory cells.
Public/Granted literature
- US20140376308A1 PHASE CHANGE MEMORY, WRITING METHOD THEREOF AND READING METHOD THEREOF Public/Granted day:2014-12-25
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