Invention Grant
US09398388B2 Method and circuit for testing an audio high-frequency loudspeaker being part of a loudspeaker system
有权
用于测试作为扬声器系统一部分的音频高频扬声器的方法和电路
- Patent Title: Method and circuit for testing an audio high-frequency loudspeaker being part of a loudspeaker system
- Patent Title (中): 用于测试作为扬声器系统一部分的音频高频扬声器的方法和电路
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Application No.: US14036506Application Date: 2013-09-25
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Publication No.: US09398388B2Publication Date: 2016-07-19
- Inventor: Edoardo Botti , Giovanni Gonano , Pietro Mario Adduci
- Applicant: STMicroelectronics S.r.l.
- Applicant Address: IT Agrate Brianza
- Assignee: STMICROELECTRONICS S.R.L.
- Current Assignee: STMICROELECTRONICS S.R.L.
- Current Assignee Address: IT Agrate Brianza
- Agency: Seed IP Law Group PLLC
- Priority: EP07425643 20071012
- Main IPC: H04R29/00
- IPC: H04R29/00 ; H04R1/26

Abstract:
The present invention relates to a method and a circuit for testing a tweeter. The tweeter is part of a loudspeaker system. The method includes the steps of: applying a high-frequency voltage signal to one terminal of the tweeter, whereby the high-frequency voltage signal is generated by first electronic means. The method also includes applying a constant voltage signal to the other terminal of the tweeter, whereby the constant voltage signal is generated by second electronic means. The method includes measuring a current (Iload) that flows through the tweeter into the second electronic means and determining a connect/disconnect state of the tweeter from the value of the current.
Public/Granted literature
- US20140023198A1 METHOD AND CIRCUIT FOR TESTING AN AUDIO HIGH-FREQUENCY LOUDSPEAKER BEING PART OF A LOUDSPEAKER SYSTEM Public/Granted day:2014-01-23
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