Invention Grant
- Patent Title: Lithographic apparatus and in-line cleaning apparatus
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Application No.: US14714944Application Date: 2015-05-18
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Publication No.: US09405205B2Publication Date: 2016-08-02
- Inventor: Roelof Frederik De Graaf , Hans Jansen , Bauke Jansen , Hubertus Leonardus Franciscus Heusschen
- Applicant: ASML Netherlands B.V.
- Applicant Address: NL Veldhoven
- Assignee: ASML NETHERLANDS B.V.
- Current Assignee: ASML NETHERLANDS B.V.
- Current Assignee Address: NL Veldhoven
- Agency: Pillsbury Winthrop Shaw Pittman LLP
- Main IPC: G03B27/52
- IPC: G03B27/52 ; G03B27/42 ; G03F7/20

Abstract:
A lithographic system includes an immersion type lithographic apparatus, which includes a support constructed and arranged to support a substrate, a projection system constructed and arranged to project a patterned beam of radiation onto a target portion of the substrate, a liquid confinement structure configured to at least partially fill a space between the projection system and at least one of the substrate and support with an immersion liquid, a liquid supply system arranged to provide the immersion liquid to the liquid confinement structure, and a cleaning liquid supply system arranged to provide a cleaning liquid to a surface of the lithographic apparatus that comes into contact with the immersion liquid. The system includes a switch to provide the cleaning liquid directly to the liquid confinement structure and to provide the immersion liquid indirectly to the liquid confinement structure via a liquid purification system.
Public/Granted literature
- US20150323875A1 LITHOGRAPHIC APPARATUS AND IN-LINE CLEANING APPARATUS Public/Granted day:2015-11-12
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