Invention Grant
US09410853B2 Guided wave thermography methods and systems for inspecting a structure
有权
导波热成像方法和系统,用于检查结构
- Patent Title: Guided wave thermography methods and systems for inspecting a structure
- Patent Title (中): 导波热成像方法和系统,用于检查结构
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Application No.: US13922367Application Date: 2013-06-20
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Publication No.: US09410853B2Publication Date: 2016-08-09
- Inventor: Paul J. Zombo , James F. Landy , Joseph L. Rose , Steven E. Owens , Fei Yan , Cody J. Borigo
- Applicant: Paul J. Zombo , James F. Landy , Joseph L. Rose , Steven E. Owens , Fei Yan , Cody J. Borigo
- Applicant Address: US FL Orlando US PA State College
- Assignee: SIEMENS ENERGY, INC.,FSB INC.
- Current Assignee: SIEMENS ENERGY, INC.,FSB INC.
- Current Assignee Address: US FL Orlando US PA State College
- Main IPC: G01K11/22
- IPC: G01K11/22 ; G01N25/72 ; G01N29/26 ; G01N29/06

Abstract:
Methods and systems (10) based on guided wave thermography for non-destructively inspecting structural flaws that may be present in a structure (15). For example, such systems and methods may provide the ability to selectively deliver sonic or ultrasonic energy to provide focusing and/or beam steering throughout the structure from a fixed transducer location (12, 14, 16). Moreover, such systems and methods may provide the ability to selectively apply sonic or ultrasonic energy having excitation characteristics (FIGS. 11 and 12) which may be uniquely tailored to enhance the thermal response (FIGS. 5 and 7) of a particular flaw geometry and/or flaw location.
Public/Granted literature
- US20130343424A1 GUIDED WAVE THERMOGRAPHY METHODS AND SYSTEMS FOR INSPECTING A STRUCTURE Public/Granted day:2013-12-26
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