发明授权
US09414796B2 X-ray recording system for x-ray imaging at high image frequencies of an object under examination by way of direct measurement of the interference pattern
有权
X射线记录系统,用于通过直接测量干涉图案的被检查物体的高图像频率进行X射线成像
- 专利标题: X-ray recording system for x-ray imaging at high image frequencies of an object under examination by way of direct measurement of the interference pattern
- 专利标题(中): X射线记录系统,用于通过直接测量干涉图案的被检查物体的高图像频率进行X射线成像
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申请号: US14219436申请日: 2014-03-19
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公开(公告)号: US09414796B2公开(公告)日: 2016-08-16
- 发明人: Philipp Bernhardt , Martin Spahn
- 申请人: SIEMENS AKTIENGESELLSCHAFT
- 申请人地址: DE Munich
- 专利权人: SIEMENS AKTIENGESELLSCHAFT
- 当前专利权人: SIEMENS AKTIENGESELLSCHAFT
- 当前专利权人地址: DE Munich
- 代理机构: Harness, Dickey & Pierce, P.L.C.
- 优先权: DE102013205406 20130327
- 主分类号: A61B6/00
- IPC分类号: A61B6/00
摘要:
An x-ray recording system is disclosed for x-ray imaging of an object under examination by way of direct measurement of an interference pattern, especially for differential, real-time capable phase-contrast imaging. In at least one embodiment, the system includes with at least one x-ray emitter for creating quasi-coherent x-ray radiation; an x-ray image detector, including a detector layer and detector pixels arranged in a matrix; and a diffraction or phase grating, disposed between the object under examination and the x-ray image detector, configured to create an interference pattern, directly detectable in the nth Talbot order by an x-ray image detector with a very high achievable local resolution, which amounts to at least half the wavelength of the interference pattern in accordance with the Nyquist theory arising in the nth Talbot order.
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