发明授权
US09414796B2 X-ray recording system for x-ray imaging at high image frequencies of an object under examination by way of direct measurement of the interference pattern 有权
X射线记录系统,用于通过直接测量干涉图案的被检查物体的高图像频率进行X射线成像

X-ray recording system for x-ray imaging at high image frequencies of an object under examination by way of direct measurement of the interference pattern
摘要:
An x-ray recording system is disclosed for x-ray imaging of an object under examination by way of direct measurement of an interference pattern, especially for differential, real-time capable phase-contrast imaging. In at least one embodiment, the system includes with at least one x-ray emitter for creating quasi-coherent x-ray radiation; an x-ray image detector, including a detector layer and detector pixels arranged in a matrix; and a diffraction or phase grating, disposed between the object under examination and the x-ray image detector, configured to create an interference pattern, directly detectable in the nth Talbot order by an x-ray image detector with a very high achievable local resolution, which amounts to at least half the wavelength of the interference pattern in accordance with the Nyquist theory arising in the nth Talbot order.
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