A method, system, and apparatus for non-destructively characterizing one or more regions within an ultra-hard polycrystalline structure using capacitance measurements. The apparatus includes a capacitance measuring device having a positive and negative terminal, a leached component comprising a polycrystalline structure, a first wire, and a second wire. The leached component includes a first surface and an opposing second surface. The first wire electrically couples the positive terminal to one of the surfaces of the leached component and the second wire electrically couples the negative terminal to the other surface of the leached component. The capacitance is measured one or more times and compared to a calibration curve to determine an estimated leaching depth within the polycrystalline structure. A data scattering range is ascertained to determine a relative porosity of the polycrystalline structure or the leaching quality within the polycrystalline structure.