Invention Grant
- Patent Title: Illumination device and reflection characteristic measuring device
- Patent Title (中): 照明装置和反射特性测量装置
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Application No.: US14894821Application Date: 2014-05-15
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Publication No.: US09429472B2Publication Date: 2016-08-30
- Inventor: Shinichi Iida , Wataru Yamaguchi
- Applicant: KONICA MINOLTA, INC.
- Applicant Address: JP Tokyo
- Assignee: Konica Minolta, Inc.
- Current Assignee: Konica Minolta, Inc.
- Current Assignee Address: JP Tokyo
- Agency: Baker & Hostetler LLP
- Priority: JP2013-112846 20130529
- International Application: PCT/JP2014/062962 WO 20140515
- International Announcement: WO2014/192554 WO 20141204
- Main IPC: G01J3/00
- IPC: G01J3/00 ; G01J3/42 ; G01J3/10 ; G01J3/50 ; G01J1/42 ; G01J3/04

Abstract:
An illumination device is provided with a light source, a photodetector, and a support structure. The light source, which emits light, has light distribution in which a reference axis serves as an axis of symmetry or light distribution in which a plane including the reference axis serves as a plane of symmetry. A first light beam in the light is guided to the object to be illuminated. A second light beam in the light is guided to the photodetector. The photodetector detects intensity of the second light beam. The light source and the photodetector are supported by the support structure in positions and postures that allow the first light beam and the second light beam to be guided in an aforementioned manner. A traveling direction of the first light beam and a traveling direction of the second light beam make the same angle with the reference axis.
Public/Granted literature
- US20160109293A1 Illumination Device and Reflection Characteristic Measuring Device Public/Granted day:2016-04-21
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