Invention Grant
US09430609B2 Electronic device and method for analyzing adjoining parts of a product
有权
用于分析产品的相邻部分的电子装置和方法
- Patent Title: Electronic device and method for analyzing adjoining parts of a product
- Patent Title (中): 用于分析产品的相邻部分的电子装置和方法
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Application No.: US13336007Application Date: 2011-12-23
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Publication No.: US09430609B2Publication Date: 2016-08-30
- Inventor: Chih-Kuang Chang , Zhong-Kui Yuan , Li Jiang , Dong-Hai Li , Xiao-Guang Xue
- Applicant: Chih-Kuang Chang , Zhong-Kui Yuan , Li Jiang , Dong-Hai Li , Xiao-Guang Xue
- Applicant Address: CN Shenzhen
- Assignee: Zijilai Innovative Services Co., Ltd.
- Current Assignee: Zijilai Innovative Services Co., Ltd.
- Current Assignee Address: CN Shenzhen
- Agent Zhigang Ma
- Main IPC: G01C9/00
- IPC: G01C9/00 ; G06F17/50 ; G06F3/0346 ; G06F3/038 ; G01B11/30 ; G01B11/24

Abstract:
A scanner obtains point-cloud data of adjoining parts of a product. A computing device reads two point-clouds from the point-cloud data, fits two or more lines according to the two point-clouds, selects two lines that have the same ascending direction from the two or more lines, and creates a two-dimensional coordinates system base on the two selected lines. The computing device determines a highest point in each of the two point-clouds based on distances from each point in either of the point-clouds to a corresponding selected line, and determines two nearest points in the two point-clouds. A difference between Y coordinates of the two highest points is determined as a gap-height of two adjoining parts of the product, and a difference between X coordinates of the two nearest points is determined as a gap-width between two adjoining parts.
Public/Granted literature
- US20120232835A1 ELECTRONIC DEVICE AND METHOD FOR ANALYZING ADJOINING PARTS OF A PRODUCT Public/Granted day:2012-09-13
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