Invention Grant
- Patent Title: Electrically insulating thermal interface on the discontinuity of an encapsulation structure
-
Application No.: US14501070Application Date: 2014-09-30
-
Publication No.: US09437513B2Publication Date: 2016-09-06
- Inventor: Edward Fuergut , Manfred Mengel
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Priority: DE102013220880 20131015
- Main IPC: H01L23/31
- IPC: H01L23/31 ; H01L23/367 ; H01L21/52 ; H01L21/56 ; H01L23/433 ; H01L23/373

Abstract:
Method for manufacturing an electronic semiconductor package, in which method an electronic chip (100) is coupled to a carrier, the electronic chip is at least partially encapsulated by means of an encapsulation structure having a discontinuity, and the carrier is partially encapsulated, and at least one part of the discontinuity and a volume connected thereto adjoining an exposed surface section of the carrier are covered by an electrically insulating thermal interface structure, which electrically decouples at least one part of the carrier with respect to its surroundings.
Public/Granted literature
- US20150102479A1 Electrically insulating thermal interface on the discontinuity of an encapsulation structure Public/Granted day:2015-04-16
Information query
IPC分类: