发明授权
- 专利标题： Light activated test connections
- 专利标题（中）： 光激活测试连接
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申请号： US13689090申请日： 2012-11-29
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公开(公告)号： US09437670B2公开(公告)日： 2016-09-06
- 发明人: Nathaniel R. Chadwick , John B. DeForge , John J. Ellis-Monaghan , Jeffrey P. Gambino , Ezra D. Hall , Marc D. Knox , Kirk D. Peterson
- 申请人： INTERNATIONAL BUSINESS MACHINES CORPORATION
- 申请人地址： KY Grand Cayman
- 专利权人： GLOBALFOUNDRIES INC.
- 当前专利权人： GLOBALFOUNDRIES INC.
- 当前专利权人地址： KY Grand Cayman
- 代理机构： Roberts Mlotkowski Safran Cole & Calderon, P.C.
- 代理商 David Cain; Andrew M. Calderon
- 主分类号： G01R31/02
- IPC分类号： G01R31/02 ; H01L29/00 ; H01L21/66 ; G01R31/28
摘要：
A test circuit including a light activated test connection in a semiconductor device is provided. The light activated test connection is electrically conductive during a test of the semiconductor device and is electrically non-conductive after the test.
公开/授权文献
- US20140145747A1 LIGHT ACTIVATED TEST CONNECTIONS 公开/授权日：2014-05-29
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