Invention Grant
US09442013B2 Microscope spectrometer, optical axis shift correction device, spectroscope and microscope using same
有权
显微镜光谱仪,光轴偏移校正装置,分光镜和显微镜使用相同
- Patent Title: Microscope spectrometer, optical axis shift correction device, spectroscope and microscope using same
- Patent Title (中): 显微镜光谱仪,光轴偏移校正装置,分光镜和显微镜使用相同
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Application No.: US13897981Application Date: 2013-05-20
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Publication No.: US09442013B2Publication Date: 2016-09-13
- Inventor: Mitsuhiro Iga
- Applicant: YOKOGAWA ELECTRIC CORPORATION
- Applicant Address: JP Tokyo
- Assignee: YOKOGAWA ELECTRIC CORPORATION
- Current Assignee: YOKOGAWA ELECTRIC CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Priority: JP2010-259921 20101122; JP2010-279100 20101215; JP2010-280576 20101216
- Main IPC: G01J3/44
- IPC: G01J3/44 ; G01J3/06 ; G01J3/26 ; G01J3/32 ; G01N21/65 ; G01J3/02 ; G01J3/12 ; G02B21/00

Abstract:
A microscope spectrometer in which, when an excitation light from a light source illuminates a sample, a light emitted from the sample that enters a microscope is analyzed, may include: a first optical means that forms the light emitted from the sample as a parallel beam; a first variable bandpass filter means having a variable wavelength passband that transmits incident light, which of the parallel beam of incident light, is light of a pre-established wavelength passband; a two-dimensional array light detection means that images the light in the wavelength passband; and a control means that controls the timing of the imaging by the two-dimensional array light detection means and, in accordance with the timing, changes the wavelength passband of the first variable bandpass filter means.
Public/Granted literature
- US20130258332A1 MICROSCOPE SPECTROMETER, OPTICAL AXIS SHIFT CORRECTION DEVICE, SPECTROSCOPE AND MICROSCOPE USING SAME Public/Granted day:2013-10-03
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