Invention Grant
US09442013B2 Microscope spectrometer, optical axis shift correction device, spectroscope and microscope using same 有权
显微镜光谱仪,光轴偏移校正装置,分光镜和显微镜使用相同

Microscope spectrometer, optical axis shift correction device, spectroscope and microscope using same
Abstract:
A microscope spectrometer in which, when an excitation light from a light source illuminates a sample, a light emitted from the sample that enters a microscope is analyzed, may include: a first optical means that forms the light emitted from the sample as a parallel beam; a first variable bandpass filter means having a variable wavelength passband that transmits incident light, which of the parallel beam of incident light, is light of a pre-established wavelength passband; a two-dimensional array light detection means that images the light in the wavelength passband; and a control means that controls the timing of the imaging by the two-dimensional array light detection means and, in accordance with the timing, changes the wavelength passband of the first variable bandpass filter means.
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