Invention Grant
- Patent Title: Hardness tester having offset correction feature
- Patent Title (中): 硬度测试仪具有偏移校正功能
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Application No.: US13832631Application Date: 2013-03-15
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Publication No.: US09442054B2Publication Date: 2016-09-13
- Inventor: Fumihiro Takemura , Fumihiko Koshimizu
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2012-070581 20120327
- Main IPC: G01N3/42
- IPC: G01N3/42 ; G01N3/06

Abstract:
A hardness tester enabling a user to form an indentation in a desired test position, capable of performing an accurate hardness test even when center positions of an indenter and a field lens are offset. The hardness tester includes an XY stage displacing a sample stage in a horizontal direction; a CCD camera capturing images of a sample surface via a field lens; a monitor displaying the images; a turret capable of selectively positioning the indenter or the field lens in a predetermined position opposite the sample; a memory storing an amount of horizontal direction offset between the center positions of the indenter and the field lens when positioned in the predetermined position; and a CPU displaying, based on the amount of offset stored in the memory, a mark indicating the center position of the indenter on the monitor when the field lens is positioned in the predetermined position.
Public/Granted literature
- US20130258094A1 HARDNESS TESTER Public/Granted day:2013-10-03
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