Invention Grant
- Patent Title: Method of electron beam transport in an X-ray scanner
- Patent Title (中): X射线扫描仪中电子束传输的方法
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Application No.: US14270874Application Date: 2014-05-06
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Publication No.: US09442213B2Publication Date: 2016-09-13
- Inventor: Joseph Bendahan , James Kevin Jones , Deepa Angal-Kalinin , Kiril Borisov Marinov
- Applicant: Rapiscan Systems, Inc.
- Applicant Address: US CA Torrance
- Assignee: Rapiscan Systems, Inc.
- Current Assignee: Rapiscan Systems, Inc.
- Current Assignee Address: US CA Torrance
- Agency: Novel IP
- Main IPC: G01V5/00
- IPC: G01V5/00 ; G01T3/00

Abstract:
The present invention provides a multi-view X-ray inspection system. In one embodiment, a beam steering mechanism directs the electron beam from an X-ray source to multiple production targets which generate X-rays for scanning which are subsequently detected by a plurality of detectors to produce multiple image slices (views). The system is adapted for use in CT systems. In one embodiment of a CT system, an electron beam generated by a single radiation source is steered by an electron beam transport mechanism comprising at least two dipoles and a quadrupole on to a target arranged in an approximated arc. The inspection system, in any configuration, can be deployed inside a vehicle for use as a mobile detection system.
Public/Granted literature
- US20150014526A1 Method of Electron Beam Transport in an X-Ray Scanner Public/Granted day:2015-01-15
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