Invention Grant
- Patent Title: Electrostatic clamp
- Patent Title (中): 静电夹
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Application No.: US14380622Application Date: 2013-01-29
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Publication No.: US09455172B2Publication Date: 2016-09-27
- Inventor: Tjarko Adriaan Rudolf Van Empel
- Applicant: ASML Netherlands B.V.
- Applicant Address: NL Veldhoven
- Assignee: ASML NETHERLANDS B.V.
- Current Assignee: ASML NETHERLANDS B.V.
- Current Assignee Address: NL Veldhoven
- Agency: Pillsbury Winthrop Shaw Pittman LLP
- International Application: PCT/EP2013/051679 WO 20130129
- International Announcement: WO2013/127589 WO 20130906
- Main IPC: H01L21/683
- IPC: H01L21/683 ; G03F7/20

Abstract:
An electrostatic clamp configured to, in use, hold an article, such as a reticle or a wafer in a lithographic apparatus. The clamp includes a lower portion; an upper portion formed of a dielectric material, and a plurality of electrodes disposed between the lower portion and the upper portion. The electrodes include a first electrode configured in use to be held at a first voltage, at least one intermediate electrode configured in use to be held at a second voltage, and a ground electrode. The at least one intermediate electrode is located between the first electrode and the ground electrode and the second voltage is between the first voltage and ground to reduce the voltage across a barrier between the electrodes and so reduce the risk of high-voltage breakdown.
Public/Granted literature
- US20150036258A1 ELECTROSTATIC CLAMP Public/Granted day:2015-02-05
Information query
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