发明授权
US09455792B1 System and method for measuring passive intermodulation (PIM) in a device under test (DUT)
有权
被测设备（DUT）中被动互调（PIM）的测量系统和方法
- 专利标题： System and method for measuring passive intermodulation (PIM) in a device under test (DUT)
- 专利标题（中）： 被测设备（DUT）中被动互调（PIM）的测量系统和方法
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申请号： US14601454申请日： 2015-01-21
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公开(公告)号： US09455792B1公开(公告)日： 2016-09-27
- 发明人: Derek Truesdale , Wesley Whiteley
- 申请人： Anritsu Company
- 申请人地址： US CA Morgan Hill
- 专利权人： ANRITSU COMPANY
- 当前专利权人： ANRITSU COMPANY
- 当前专利权人地址： US CA Morgan Hill
- 代理机构： Tucker Ellis LLP
- 主分类号： H04B17/00
- IPC分类号： H04B17/00 ; H04B17/10 ; G01R25/04 ; H04B17/11
摘要：
In an embodiment, a method for calculating PIM associated with a DUT comprises obtaining a first measurement of PIM with the DUT connected to the measuring instrument, introducing a shift in a phase offset of PIM produced at the DUT in response to test signals generated by the measuring instrument, obtaining, upon introducing the shift, a second measurement of PIM with the DUT connected to the measuring instrument and calculating the PIM associated with the DUT based on the first measurement and the second measurement.
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