Invention Grant
- Patent Title: Measurement system utilizing a frequency-dithered local oscillator
- Patent Title (中): 利用频率抖动本地振荡器的测量系统
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Application No.: US13938495Application Date: 2013-07-10
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Publication No.: US09459295B2Publication Date: 2016-10-04
- Inventor: Daniel S. Wertz
- Applicant: NATIONAL INSTRUMENTS CORPORATION
- Applicant Address: US TX Austin
- Assignee: National Instruments Corporation
- Current Assignee: National Instruments Corporation
- Current Assignee Address: US TX Austin
- Agency: Meyertons Hood Kivlin Kowert & Goetzel, P.C.
- Agent Jeffrey C. Hood
- Main IPC: H03B28/00
- IPC: H03B28/00 ; G01R23/16 ; G01R27/28

Abstract:
An improved receiver system may include an input to receive an input signal, and a signal generating circuit to generate a desired oscillator signal that is a single sideband radio frequency signal of time varying frequency. The receiver may also include a downconversion stage to generate an intermediate frequency (IF) signal based on the input signal and the desired oscillator signal. A signal processing block in the receiver may be used to produce an output signal based on the IF signal by frequency shifting the IF signal by an amount that compensates for the time varying frequency of the desired oscillator signal. The desired oscillator signal may be generated using a vector signal generator that receives a control value from the signal processing block, converts the control value to a pair of analog input signals, and generates the desired oscillator signal by quadrature modulating the pair of analog input signals.
Public/Granted literature
- US20150015238A1 Measurement System Utilizing a Frequency-Dithered Local Oscillator Public/Granted day:2015-01-15
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