发明授权
- 专利标题: Semiconductor packages and methods for fabricating the same
- 专利标题(中): 半导体封装及其制造方法
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申请号: US14744031申请日: 2015-06-19
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公开(公告)号: US09461029B2公开(公告)日: 2016-10-04
- 发明人: Hye-young Jang , Chang-Seong Jeon , Chajea Jo , Taeje Cho
- 申请人: Hye-young Jang , Chang-Seong Jeon , Chajea Jo , Taeje Cho
- 申请人地址: KR Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do
- 专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人: SAMSUNG ELECTRONICS CO., LTD.
- 当前专利权人地址: KR Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do
- 代理机构: Muir Patent Law, PLLC
- 优先权: KR10-2014-0080054 20140627
- 主分类号: H01L21/50
- IPC分类号: H01L21/50 ; H01L25/00 ; H01L25/065 ; H01L23/00 ; H01L25/18 ; H01L23/31
摘要:
A semiconductor package may include a first semiconductor chip including a first surface facing a package substrate, a second surface opposite to the first surface, and at least one through-electrode penetrating the first semiconductor chip, a molding layer molding the first semiconductor chip and exposing the second surface of the first semiconductor chip, a second semiconductor chip stacked on the second surface of the first semiconductor chip, and a non-conductive film provided between the first and second semiconductor chips. The second semiconductor chip includes an overhang portion extending past an edge of the first semiconductor chip. For example, a size of the second semiconductor chip may be greater than that of the first semiconductor chip, so the second semiconductor chip has an overhang. The second semiconductor chip includes at least one interconnecting terminal electrically connected to the at least one through-electrode.
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