Invention Grant
- Patent Title: Method and apparatus for measuring hardened surface layer
- Patent Title (中): 测量硬化表面层的方法和装置
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Application No.: US13822555Application Date: 2011-09-16
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Publication No.: US09464889B2Publication Date: 2016-10-11
- Inventor: Arisa Yanagihara , Minoru Tagami , Kenichiro Watanabe , Yoshinori Ishida
- Applicant: Arisa Yanagihara , Minoru Tagami , Kenichiro Watanabe , Yoshinori Ishida
- Applicant Address: JP Tokyo
- Assignee: IHI CORPORATION
- Current Assignee: IHI CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Volpe and Koenig, P.C.
- Priority: JP2010-207975 20100916
- International Application: PCT/JP2011/071192 WO 20110916
- International Announcement: WO2012/036258 WO 20120322
- Main IPC: G01N29/07
- IPC: G01N29/07 ; G01B17/02 ; G01N29/44 ; G01N29/30

Abstract:
A method comprises a calibration curve creation step in which a calibration curve is created on the basis of hardened surface layer depth. A destructive test is performed on one of two samples in pairs, and propagation time of a first peak of a first wave of waveform of a signal outputted with the other in pairs in a non-destructive test is determined, the samples in pairs being prepared such that carburization depth varies gradually from pair to pair. A waveform of a signal outputted with a to-be-inspected piece is obtained. The propagation time of a first peak of a first wave of the waveform of the signal output with the to-be-inspected piece is obtained, and the hardened surface layer depth of the to-be-inspected piece is obtained using the calibration curve, on the basis of the propagation time obtained with the to-be-inspected sample.
Public/Granted literature
- US20130231884A1 METHOD AND APPARATUS FOR MEASURING HARDENED SURFACE LAYER Public/Granted day:2013-09-05
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