发明授权
- 专利标题: Method and apparatus for measuring hardened surface layer
- 专利标题(中): 测量硬化表面层的方法和装置
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申请号: US13822555申请日: 2011-09-16
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公开(公告)号: US09464889B2公开(公告)日: 2016-10-11
- 发明人: Arisa Yanagihara , Minoru Tagami , Kenichiro Watanabe , Yoshinori Ishida
- 申请人: Arisa Yanagihara , Minoru Tagami , Kenichiro Watanabe , Yoshinori Ishida
- 申请人地址: JP Tokyo
- 专利权人: IHI CORPORATION
- 当前专利权人: IHI CORPORATION
- 当前专利权人地址: JP Tokyo
- 代理机构: Volpe and Koenig, P.C.
- 优先权: JP2010-207975 20100916
- 国际申请: PCT/JP2011/071192 WO 20110916
- 国际公布: WO2012/036258 WO 20120322
- 主分类号: G01N29/07
- IPC分类号: G01N29/07 ; G01B17/02 ; G01N29/44 ; G01N29/30
摘要:
A method comprises a calibration curve creation step in which a calibration curve is created on the basis of hardened surface layer depth. A destructive test is performed on one of two samples in pairs, and propagation time of a first peak of a first wave of waveform of a signal outputted with the other in pairs in a non-destructive test is determined, the samples in pairs being prepared such that carburization depth varies gradually from pair to pair. A waveform of a signal outputted with a to-be-inspected piece is obtained. The propagation time of a first peak of a first wave of the waveform of the signal output with the to-be-inspected piece is obtained, and the hardened surface layer depth of the to-be-inspected piece is obtained using the calibration curve, on the basis of the propagation time obtained with the to-be-inspected sample.
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