Invention Grant
US09465074B2 System and method for measuring switching loss associated with semiconductor switching devices
有权
用于测量与半导体开关器件相关的开关损耗的系统和方法
- Patent Title: System and method for measuring switching loss associated with semiconductor switching devices
- Patent Title (中): 用于测量与半导体开关器件相关的开关损耗的系统和方法
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Application No.: US14049448Application Date: 2013-10-09
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Publication No.: US09465074B2Publication Date: 2016-10-11
- Inventor: Chingchi Chen , Krishna Prasad Bhat , Michael W. Degner , Ke Zou
- Applicant: Ford Global Technologies, LLC
- Applicant Address: US MI Dearborn
- Assignee: Ford Global Technologies, LLC
- Current Assignee: Ford Global Technologies, LLC
- Current Assignee Address: US MI Dearborn
- Agency: Carlson, Gaskey & Olds
- Main IPC: G01R31/327
- IPC: G01R31/327 ; H01L23/34
Abstract:
A method according to an exemplary aspect of the present disclosure includes, among other things, controlling a vehicle using switching loss information of a semiconductor switching device, the switching loss information derived from a conduction loss and a combined conduction and switching loss.
Public/Granted literature
- US20150098187A1 SYSTEM AND METHOD FOR MEASURING SWITCHING LOSS ASSOCIATED WITH SEMICONDUCTOR SWITCHING DEVICES Public/Granted day:2015-04-09
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