发明授权
- 专利标题: Semiconductor device capable of rescuing defective characteristics occurring after packaging
- 专利标题(中): 能够挽救包装后发生的缺陷特性的半导体装置
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申请号: US14997041申请日: 2016-01-15
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公开(公告)号: US09466393B2公开(公告)日: 2016-10-11
- 发明人: Jeong-kyoum Kim , Seok-hun Hyun , Jung-hwan Choi , Seong-jin Jang
- 申请人: Jeong-kyoum Kim , Seok-hun Hyun , Jung-hwan Choi , Seong-jin Jang
- 代理机构: Myers Bigel & Sibley
- 优先权: KR10-2012-0019830 20120227
- 主分类号: G11C17/18
- IPC分类号: G11C17/18 ; G11C29/04 ; G11C29/44 ; G11C29/00 ; G11C17/16 ; G11C5/04 ; G11C11/40
摘要:
A memory device capable of rescuing defective characteristics that occur after packaging includes a memory cell array including a plurality of memory cells and an antifuse circuit unit including at least one antifuse. The antifuse circuit unit stores a defective cell address of the memory cell array in the at least one antifuse and reads the defective cell address to an external source. The antifuse circuit unit stores a defective characteristic code in the at least one antifuse, wherein the defective characteristic code is related to at least one of a timing parameter spec., a refresh spec., an input/output (I/O) trigger voltage spec., and a data training spec. of the memory device, and outputs the defective characteristic code to an external source.