发明授权
US09466479B2 System and process for high-density, low-energy plasma enhanced vapor phase epitaxy
有权
用于高密度,低能量等离子体增强气相外延的系统和工艺
- 专利标题: System and process for high-density, low-energy plasma enhanced vapor phase epitaxy
- 专利标题(中): 用于高密度,低能量等离子体增强气相外延的系统和工艺
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申请号: US13792238申请日: 2013-03-11
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公开(公告)号: US09466479B2公开(公告)日: 2016-10-11
- 发明人: Hans Von Känel
- 申请人: Sulzer Metco AG
- 申请人地址: CH Wohlen
- 专利权人: OERLIKON METCO AG, WOHLEN
- 当前专利权人: OERLIKON METCO AG, WOHLEN
- 当前专利权人地址: CH Wohlen
- 代理机构: Da Vinci Partners LLC
- 代理商 John Moetteli
- 优先权: WOPCT/IB2006/000421 20060228
- 主分类号: C30B23/02
- IPC分类号: C30B23/02 ; H01L21/02 ; C30B29/38 ; C30B23/08 ; C30B25/10 ; C30B29/40 ; C30B23/06
摘要:
A process for epitaxial deposition of compound semiconductor layers includes several steps. In a first step, a substrate is removably attached to a substrate holder that may be heated. In a second step, the substrate is heated to a temperature suitable for epitaxial deposition. In a third step, substances are vaporized into vapor particles, such substances including at least one of a list of substances, comprising elemental metals, metal alloys and dopants. In a fourth step, the vapor particles are discharged to the deposition chamber. In a fifth step, a pressure is maintained in the range of 10^−3 to 1 mbar in the deposition chamber by supplying a mixture of gases comprising at least one gas, wherein vapor particles and gas particles propagate diffusively. In a sixth optional step, a magnetic field may be applied to the deposition chamber. In a seventh step, the vapor particles and gas particles are activated by a plasma in direct contact with the sample holder. In an eighth step, vapor particles and gas particles are allowed to react, so as to form a uniform epitaxial layer on the heated substrate by low-energy plasma-enhanced vapor phase epitaxy.
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