发明授权
- 专利标题: Memory device and read method of memory device
- 专利标题(中): 存储器件的存储器件和读取方法
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申请号: US14629616申请日: 2015-02-24
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公开(公告)号: US09478299B2公开(公告)日: 2016-10-25
- 发明人: Kyung-Ryun Kim
- 申请人: SAMSUNG ELECTRONICS CO., LTD.
- 申请人地址: KR Suwon-si, Gyeonggi-do
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon-si, Gyeonggi-do
- 代理机构: Volentine & Whitt, PLLC
- 优先权: KR10-2014-0096217 20140729
- 主分类号: G11C16/26
- IPC分类号: G11C16/26 ; G11C16/14 ; G11C8/08 ; G11C8/14 ; G11C16/04 ; G11C16/08
摘要:
In a method of reading a memory device, difference information is generated based on a distance difference between a position of a read word-line and a position of a boundary word-line. The read word-line corresponds to a read address. The boundary word-line corresponds to a last programmed word-line in a memory block included in a memory cell array. A read word-line voltage and an adjacent word-line voltage are determined based on the difference information. The read word-line voltage is applied to the read word-line. The adjacent word-line voltage is applied to an adjacent word-line that is adjacent to the read word-line. A read data corresponding to the read address is outputted based on the read word-line voltage and the adjacent word-line voltage. The read method of the memory device according to example embodiments may be capable of increasing the performance by controlling the voltages applied to the adjacent word-line and the read word-line according to the difference information determined based on the read word-line and the boundary word-line.
公开/授权文献
- US20160035429A1 MEMORY DEVICE AND READ METHOD OF MEMORY DEVICE 公开/授权日:2016-02-04
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