Invention Grant
- Patent Title: Combined measuring and detection system
- Patent Title (中): 组合测量和检测系统
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Application No.: US13916636Application Date: 2013-06-13
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Publication No.: US09482697B2Publication Date: 2016-11-01
- Inventor: Radek Javora , Carlo Gemme , Gabriele Valentino De Natale
- Applicant: ABB Technology AG
- Applicant Address: CH Baden
- Assignee: ABB Schweiz AG
- Current Assignee: ABB Schweiz AG
- Current Assignee Address: CH Baden
- Agency: Taft Stettinius & Hollister LLP
- Priority: EP10015644 20101215
- Main IPC: G01R1/30
- IPC: G01R1/30 ; G01R31/12 ; G01R31/327

Abstract:
A combined measuring and detection system is disclosed which includes an electronic evaluation unit for analyzing a broad frequency spectrum of measured quantities and one or more measuring devices for measurement of one or more of a magnetic field, an electric field, a current, and a voltage. The measuring devices are operatively connected to the electronic evaluation unit, which is provided with at least one frequency splitter dividing the measured quantities into a low frequency component and into a high frequency component. Low frequency components are used for measurement and protection analysis and high frequency components are used to detect partial discharges activity.
Public/Granted literature
- US20130271116A1 COMBINED MEASURING AND DETECTION SYSTEM Public/Granted day:2013-10-17
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